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IEEE Transactions on Reliability, Volume 53
Volume 53, Number 1, March 2004
- William A. Marsh:
Opinion item: cancelled US-military specifications. 1-2 - Min-Sheng Lin:
An O(k2·log(n)) algorithm for computing the reliability of consecutive-k-out-of-n: F systems. 3-6 - Philip J. Boland, Francisco J. Samaniego:
Stochastic ordering results for consecutive k-out-of-n: F systems. 7-10 - Chanseok Park
, K. B. Kulasekera:
Parametric inference of incomplete data with competing risks among several groups. 11-21 - Chengjie Xiong, Ming Ji:
Analysis of grouped and censored data from step-stress life test. 22-28 - Uditha Balasooriya, Chan-Kee Low:
Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. 29-36 - Jun Bai, Hoang Pham:
Discounted warranty cost of minimally repaired series systems. 37-42 - Shi-Ning Ju, Cheng-Liang Chen, Chuei-Tin Chang:
Constructing fault trees for advanced process control systems $application to cascade control loops. 43-60 - Mahmud Fotuhi-Firuzabad, Roy Billinton, T. S. Munian, B. Vinayagam:
A novel approach to determine minimal tie-sets of complex network. 61-70 - Yash P. Aneja, R. Chandrasekaran, K. P. K. Nair:
Minimal-cost system reliability with discrete-choice sets for components. 71-76 - Wei Huang, Ronald G. Askin:
A generalized SSI reliability model considering stochastic loading and strength aging degradation. 77-82 - E. L. Meyer, E. E. van Dyk:
Assessing the reliability and degradation of photovoltaic module performance parameters. 83-92 - Inki Hong, Miodrag Potkonjak, Ramesh Karri
A heterogeneous built-in self-repair approach using system-level synthesis flexibility. 93-101 - Yong Guan, Xinwen Fu, Riccardo Bettati, Wei Zhao
A quantitative analysis of anonymous communications. 103-115 - Nong Ye, Yebin Zhang, Connie M. Borror:
Robustness of the Markov-chain model for cyber-attack detection. 116-123 - Roy A. Maxion, Tahlia N. Townsend:
Masquerade detection augmented with error analysis. 124-147 - O. Patrick Kreidl, Tiffany M. Frazier:
Feedback control applied to survivability: a host-based autonomic defense system. 148-166
Volume 53, Number 2, June 2004
- Liudong Xing, Joanne Bechta Dugan:
Comments on PMS BDD generation in 'A BDD-based algorithm for Reliability Analysis of phased-mission systems'. 169-173 - Liudong Xing, Joanne Bechta Dugan:
A separable ternary decision diagram based analysis of generalized phased-mission reliability. 174-184 - Rafael Pérez-Ocón, Delia Montoro-Cazorla
Transient analysis of a repairable system, using phase-type distributions and geometric processes. 185-192 - Lirong Cui, Way Kuo
Optimal allocation of minimal & perfect repairs under resource constraints. 193-199 - Debra A. Elkins, M. A. Wortman:
An examination of correlation effects among warranty claims. 200-204 - Yinong Chen
Bounds on the reliability of distributed systems with unreliable nodes & links. 205-215 - Pin-Han Ho, János Tapolcai
On achieving optimal survivable routing for shared protection in survivable next-generation Internet. 216-225 - Michael T. Todinov:
Reliability governed by the relative locations of random variables following a homogeneous Poisson Process in a finite domain. 226-237 - Alma Riska, Evgenia Smirni, Gianfranco Ciardo
Exact analysis of a class of GI/G/1-type performability models. 238-249 - K. S. Chandra, T. V. Ramanathan:
Modeling inefficiencies in a reliability system using stochastic frontier regression. 250-254 - Dilip Roy:
Discrete Rayleigh distribution. 255-260 - Maxim S. Finkelstein
Alternative time scales for systems with random usage. 261-264 - Maxim S. Finkelstein
On the exponential formula for reliability. 265-268 - Yiorgos Makris
Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. 269-278 - Jingsong Xie, Michael G. Pecht
Contact discontinuity modeling of electromechanical switches. 279-283 - Francis G. Pascual:
Optimal test planning for the fatigue-limit model when the fatigue-limit distribution is known. 284-292 - Stefan Dilhaire, Stéphane Grauby
Strain energy imaging of a power MOS transistor using speckle interferometry. 293-296
Volume 53, Number 3, September 2004
- Luis González, Diego García, Blas Galván:
An intrinsic order criterion to evaluate large, complex fault trees. 297-305 - Ajodhya Nath Das, Damodar Acharya:
Age replacement of components during IFR delay time. 306-312 - Rosario Romera, José E. Valdés
Active-redundancy allocation in systems. 313-318 - Gholamreza Latif Shabgahi, Julian M. Bass
A taxonomy for software voting algorithms used in safety-critical systems. 319-328 - Shing-Chi Cheung
Applying generic timing tests for distributed multimedia software systems. 329-341 - Michele Favalli
TMR voting in the presence of crosstalk faults at the voter inputs. 342-348 - N. Balakrishnan, H. K. T. Ng, N. Kannan:
Goodness-of-fit tests based on spacings for progressively type-II censored data from a general location-scale distribution. 349-356 - Birdal Senoglu, B. Surucu:
Goodness-of-fit tests based on Kullback-Leibler information. 357-361 - Jinsheng Huang, Ming Jian Zuo:
Dominant multi-state systems. 362-368 - David W. Coit, Tongdan Jin, Naruemon Wattanapongsakorn:
System optimization with component reliability estimation uncertainty: a multi-criteria approach. 369-380 - Yi-Kuei Lin:
Reliability of a stochastic-flow network with unreliable branches & nodes, under budget constraints. 381-387 - Evans Gouno, Ananda Sen, N. Balakrishnan:
Optimal step-stress test under progressive type-I censoring. 388-393 - Gregory Levitin:
Consecutive k-out-of-r-from-n system with multiple failure criteria. 394-400 - Nozer D. Singpurwalla, Chung-Wai Kong:
Specifying interdependence in networked systems. 401-405 - Naruemon Wattanapongsakorn, Steven P. Levitan:
Reliability optimization models for embedded systems with multiple applications. 406-416 - Yun-Chia Liang, Alice E. Smith
An ant colony optimization algorithm for the redundancy allocation problem (RAP). 417-423 - Marzio Marseguerra, Enrico Zio
Optimal reliability/availability of uncertain systems via multi-objective genetic algorithms. 424-434 - Shey-Huei Sheu, Yu-Hung Chien:
Minimizing cost-functions related to both burn-in and field-operation under a generalized model. 435-439 - Georgia-Ann Klutke, Peter C. Kiessler, Martin A. Wortman
Erratum. 440 - Erratum. 440
Volume 53, Number 4, December 2004
- Stephanie R. Goldberg, Shambhu J. Upadhyaya, W. Kent Fuchs:
Recovery schemes for mesh arrays utilizing dedicated spares. 445-451 - Yuan Lin Zhang:
An optimal replacement policy for a three-state repairable system with a monotone process model. 452-457 - Frédéric Vanderhaegen, David Jouglet, Sylvain Piechowiak:
Human-reliability analysis of cooperative redundancy to support diagnosis. 458-464 - Sherif M. Yacoub, Bojan Cukic
A scenario-based reliability analysis approach for component-based software. 465-480 - Seung Min Lee, Chong Hyung Lee, Dong Ho Park:
Sequential capacity determination of subnetworks in network performance analysis. 481-486 - Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi:
Sequential diagnosis of processor array systems. 487-498 - Yong Ou, Joanne Bechta Dugan:
Modular solution of dynamic multi-phase systems. 499-508 - Andrea Bondavalli
Dependability modeling and evaluation of multiple-phased systems using DEEM. 509-522 - Amos E. Gera:
Combined k-out-of-n: G, and consecutive kc-out-of-n: G systems. 523-531 - Samit Soni, Sridhar Narasimhan, Larry J. LeBlanc:
Telecommunication access network design with reliability constraints. 532-541 - Daniel Berleant, Jianzhong Zhang:
Bounding the times to failure of 2-component systems. 542-550 - Yefim Haim Michlin, B. Sedan, Dov Ingman:
Reliability improvement of Internet web servers through statistical process control. 551-556 - Nong Ye, Qiang Chen, Connie M. Borror:
EWMA forecast of normal system activity for computer intrusion detection. 557-566 - Suprasad V. Amari, Hoang Pham, G. Dill:
Optimal design of k-out-of-n: G subsystems subjected to imperfect fault-coverage. 567-575
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