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SSIRI 2008: Yokohama, Japan
- Second International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008, July 14-17, 2008, Yokohama, Japan. IEEE Computer Society 2008, ISBN 978-0-7695-3266-0
- Clifford C. Juan, James Bret Michael, Christopher S. Eagle:
Vulnerability Analysis of HD Photo Image Viewer Applications. 1-7 - Warren W. Lin, Shiuhpyng Shieh, Jia-Chun Lin:
A Pollution Attack Resistant Multicast Authentication Scheme Tolerant to Packet Loss. 8-15 - Sylvain Guilley, Laurent Sauvage, Jean-Luc Danger, Tarik Graba, Yves Mathieu:
Evaluation of Power-Constant Dual-Rail Logic as a Protection of Cryptographic Applications in FPGAs. 16-23 - Yu Liu, Hong Zhu:
An Experimental Evaluation of the Reliability of Adaptive Random Testing Methods. 24-31 - Shin Kimoto, Tatsuhiro Tsuchiya
, Tohru Kikuno:
Pairwise Testing in the Presence of Configuration Change Cost. 32-38 - Hyuncheol Park, Hoyeon Ryu, Jongmoon Baik:
Historical Value-Based Approach for Cost-Cognizant Test Case Prioritization to Improve the Effectiveness of Regression Testing. 39-46 - Doron Drusinsky, James Bret Michael, Thomas W. Otani, Man-tak Shing:
Validating UML Statechart-Based Assertions Libraries for Improved Reliability and Assurance. 47-51 - Mohammad Reza Selim, Yuichi Goto
Ensuring Reliability and Availability of Soft System Bus. 52-59 - Yoshinobu Tamura, Shigeru Yamada:
A Method of Reliability Assessment Based on Deterministic Chaos Theory for an Open Source Software. 60-66 - Sang-Moon Ryu:
Reliability Improvement of Real-Time Embedded System Using Checkpointing. 67-72 - Koichi Tokuno, Shigeru Yamada:
Dynamic Performance Analysis for Software System Considering Real-Time Property in Case of NHPP Task Arrival. 73-80 - Valdivino Alexandre de Santiago Jr.
Shortening Test Case Execution Time for Embedded Software. 81-88 - Wei-Hung Lin, Yuh-Rau Wang, Shi-Jinn Horng:
A Blind Watermarking Scheme Based on Wavelet Tree Quantization. 89-95 - Che-Cheng Lin, Shiuhpyng Shieh, Jia-Chun Lin:
Lightweight, Distributed Key Agreement Protocol for Wireless Sensor Networks. 96-102 - Peter Zoeteweij, Jurryt Pietersma, Rui Abreu
Automated Fault Diagnosis in Embedded Systems. 103-110 - Kazuyuki Suzuki, Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto:
Two Methods for Estimating Product Lifetimes from only Warranty Claims Data. 111-119 - Pei-Chen Tseng, Jiun-Kuei Shiung, Chun-Ting Huang, Shih-Mine Guo, Wen-Shyang Hwang:
Adaptive Car Plate Recognition in QoS-Aware Security Network. 120-127 - Woei-Kae Chen, Zheng-Wen Shen, Che-Ming Chang:
GUI Test Script Organization with Component Abstraction. 128-134 - Jooyoung Seo, Yuhoon Ki, Byoungju Choi, Kwanghyun La:
Which Spot Should I Test for Effective Embedded Software Testing?. 135-142 - Mohammad Shokrollah-Shirazi, Seyed Ghassem Miremadi:
FPGA-Based Fault Injection into Synthesizable Verilog HDL Models. 143-149 - Shinji Inoue, Shigeru Yamada:
Two-Dimensional Software Reliability Assessment with Testing-Coverage. 150-157 - Hideki Nagatsuka:
A Study of Estimation for the Three-Parameter Weibull Distribution Based on Doubly Type-II Censored Data Using a Least Squares Method. 158-165 - Masato Uwajima, Toru Sasaki, Chisa Takano, Masaki Aida:
Proposal for a Communication Link Model Based on Resonance Frequency of Network Users. 166-172 - Yasuhiro Fujihara, Hitomi Oikawa, Yuko Murayama:
Towards an Interface causing Discomfort for Security: A User Survey on the Factors of Discomfort. 173-174 - Chih-Hung Chang
Improving Software Integration from Requirement Process with a Model-Based Object-Oriented Approach. 175-176 - K. Saravana Kumar, R. B. Misra:
An Enhanced Model for Early Software Reliability Prediction Using Software Engineering Metrics. 177-178 - Koichiro Sato, Yoshiki Ujiie, Yoshiyuki Matsuoka:
Application to Artificial Hip Stem Design of an Emergent Design System Applicable in the Early Process of Design. 179-180 - Subramanyam Ranganathan, Cvetan Redzic:
Application of Design for Six Sigma in Third Party Intensive Programs. 181-182 - Norman F. Schneidewind, Michael G. Hinchey
Risk-Driven Software Reliability and Testing. 183-184 - Fengzhong Zou, Joseph G. Davis:
A Model of Bug Dynamics for Open Source Software. 185-186 - Nikhil Damle
Co-Simulation of Networked Embedded System: Verification Approach. 187-188 - Shwu-Huey Yen, Chun-Wei Wang, Jih Pin Yeh, Meng-Ju Lin, Hwei-Jen Lin:
Text Extraction in Video Images. 189-190 - Nobuyuki Nishiuchi, Kimihiro Yamanaka, Kunie Beppu:
A Study of Visibility Evaluation for the Combination of Character Color and Background Color on a Web Page. 191-192 - Ruoying Sun, Xingfen Wang, Gang Zhao:
An Ant Colony Optimization Approach to Multi-Objective Supply Chain Model. 193-194 - K. Saravana Kumar, Ravindra Babu Misra, Neeraj Kumar Goyal
Development of Fuzzy Software Operational Profile. 195-196 - Tadahiro Shibutani, Qiang Yu, Masaki Shiratori:
Effect of Creep Properties on Pressure Induced Tin Whisker Formation. 197-198 - Samuel Keene:
Design of Experiments is the "Sweet Spot" of Six Sigma. 199-200 - Eunjee Song, Nathan V. Roberts:
Verifiable Aspect Composition in UML Models. 201-202 - Yongbin Zhou, Jun Yang, Yueke Wang:
A New Method for Measuring Single Event Effect Susceptibility of L1 Cache Unit. 203-204 - Shuichi Fukuda:
Detecting Emotions and Dangerous Actions for Better Human-System Team Working. 205-206 - Nobuyuki Tamura, Tetsushi Yuge, Shigeru Yanagi:
Estimation of the Change Point for Failure-Censored Data via Bayesian Information Criterion. 207-208 - Nico Wolf, Jan C. Aurich
Dependable Mechatronic Products: Closing the Intelligence Gap. 209-210 - Kun-Chun Chang, Yi-Chinag Wang, Chung-Hsien Hsu, Kuen-Long Leu, Yung-Yuan Chen:
System-Bus Fault Injection Framework in SystemC Design Platform. 211-212 - Haruka Nakao, Robert Eschbach:
Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches. 213-214 - Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto:
An Experimental Study on Latch Up Failure of CMOS LSI. 215-216 - Vasile Anghel:
Conception for Integrated Availability in Design for the Nuclear Systems. 217-223 - Yung-Yuan Chen, Shu-Hao Hsu, Kuen-Long Leu:
An Estimation Model of Vulnerability for Embedded Microprocessors. 224-225 - Wangbong Lee, Boo-Geum Jung, Jongmoon Baik:
Early Reliability Prediction: An Approach to Software Reliability Assessment in Open Software Adoption Stage. 226-227 - Shih-En Chien, I-Ta Cherng, Chih-Wen Liu
Automation of Look-Up Tables for System Integrity Protection Systems in Taiwan Power System. 228-229 - Hwei-Jen Lin, Shwu-Huey Yen, Jih Pin Yeh, Meng-Ju Lin:
Face Detection Based on Skin Color Segmentation and SVM Classification. 230-231
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