• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 62 matches

• 2023
• 
  Khaled Galal Abdelwahab Abdelaziz, Ralph Görgen, Görschwin Fey:
  FINaL: Driving High-Level Fault Injection Campaigns with Natural Language. ETS 2023: 1-4
• 
  Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin:
  DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment. ETS 2023: 1-6
• 
  Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori:
  Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation. ETS 2023: 1-4
• 
  Marti Alonso, David Andreu, Ramon Canal, Stefano Di Carlo, Cristiano Pegoraro Chenet, Juanjo Costa, Andreu Girones, Dimitris Gizopoulos, Vasileios Karakostas, Beatriz Otero, George Papadimitriou, Eva Rodríguez, Alessandro Savino:
  Validation, Verification, and Testing (VVT) of future RISC-V powered cloud infrastructures: the Vitamin-V Horizon Europe Project perspective. ETS 2023: 1-6
• 
  Lila Ammoura, Marie-Lise Flottes, Patrick Girard, Jean-Philippe Noel, Arnaud Virazel:
  Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture. ETS 2023: 1-4
• 
  Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric:
  A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. ETS 2023: 1-10
• 
  Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev:
  Global Tuning for System Performance Optimization of RF MIMO Radars. ETS 2023: 1-4
• 
  Ferhat Can Ataman, Mohammed Aladsani, Georgios C. Trichopoulos, Y. B. Chethan Kumar, Sule Ozev:
  Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors. ETS 2023: 1-6
• 
  Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand:
  Approximate Communication: Balancing Performance, Power, Reliability, and Safety. ETS 2023: 1-6
• 
  Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Zainalabedin Navabi:
  Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction. ETS 2023: 1-6
• 
  Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero:
  Semi-Supervised Deep Learning for Microcontroller Performance Screening. ETS 2023: 1-6
• 
  Alperen Bolat, Yahya Can Tugrul, Seyyid Hikmet Çelik, Sakir Sezer, Marco Ottavi, Oguz Ergin:
  DEV-PIM: Dynamic Execution Validation with Processing-in-Memory. ETS 2023: 1-6
• 
  Jayeeta Chaudhuri, Krishnendu Chakrabarty:
  Criticality Analysis of Ring Oscillators in FPGA Bitstreams ^*. ETS 2023: 1-4
• 
  Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty:
  Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors. ETS 2023: 1-4
• 
  Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda:
  Evaluating the Prevalence of SFUs in the Reliability of GPUs. ETS 2023: 1-6
• 
  Changming Cui, Tuanhui Xu, Haitao Fu, Junlin Huang:
  Physical-aware Interconnect Testing and Repairing of Chiplets. ETS 2023: 1-4
• 
  Upoma Das, M. Sazadur Rahman, N. Nalla Anandakumar, Kimia Zamiri Azar, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi:
  PSC-Watermark: Power Side Channel Based IP Watermarking Using Clock Gates. ETS 2023: 1-6
• 
  Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda:
  Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. ETS 2023: 1-5
• 
  Peter Domanski, Dirk Pflüger, Raphaël Latty:
  Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. ETS 2023: 1-4
• 
  Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker:
  Constraint-Based Automatic SBST Generation for RISC-V Processor Families. ETS 2023: 1-6
• 
  Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui:
  Online Fault Detection and Diagnosis in RRAM. ETS 2023: 1-6
• 
  Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi:
  An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? ETS 2023: 1-6
• 
  Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez:
  SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks. ETS 2023: 1-6
• 
  Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
  High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS 2023: 1-4
• 
  Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui:
  Dependability of Future Edge-AI Processors: Pandora's Box. ETS 2023: 1-6
• 
  Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler:
  Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. ETS 2023: 1-6
• 
  Yi He, Yanjing Li:
  Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems. ETS 2023: 1-6
• 
  Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu:
  BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS 2023: 1-6
• 
  Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty:
  Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning^*. ETS 2023: 1-6
• 
  Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann:
  Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. ETS 2023: 1-6

skipping 32 more matches