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"Impact of bias conditions on performance degradation in SiGe HBTs ..."

Yabin Sun et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.08.010

access: closed

type: Journal Article

metadata version: 2024-07-25

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  - https://dblp.org/rec/journals/mr/SunFXWZZCLL14
Yabin Sun, Jun Fu, Jun Xu, Yudong Wang, Wei Zhou, Wei Zhang, Jie Cui, Gaoqing Li, Zhihong Liu:
Impact of bias conditions on performance degradation in SiGe HBTs irradiated by 10 MeV Br ion. Microelectron. Reliab. 54(12): 2728-2734 (2014)

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