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"AlGaN/GaN High Electron Mobility Transistor degradation under on- and ..."

E. A. Douglas et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.09.024

access: closed

type: Journal Article

metadata version: 2024-10-06

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  - https://dblp.org/rec/journals/mr/DouglasCCGLLHWJVKJRP11
E. A. Douglas, C. Y. Chang, David J. Cheney, B. P. Gila, Chi-Fai Lo, Liu Lu, M. R. Holzworth, Patrick G. Whiting, Kevin S. Jones, Glen David Via, Jinhyung Kim, Soohwan Jang, Fan Ren, Stephen J. Pearton:
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. Microelectron. Reliab. 51(2): 207-211 (2011)

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