default search action

combined dblp search
author search
venue search
publication search

ask others

"A variational autoencoder for a semiconductor fault detection model robust ..."

Youngju Kim, Hoyeop Lee, Chang Ouk Kim (2023)

> Home

Details and statistics

DOI: 10.1007/S10845-021-01810-2

access: closed

type: Journal Article

metadata version: 2023-02-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/KimLK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/KimLK23
Youngju Kim, Hoyeop Lee, Chang Ouk Kim:
A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance. J. Intell. Manuf. 34(2): 529-540 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.