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"Sub-Pixel Level Defect Detection Based on Notch Filter and Image Registration."

Longyuan Guo et al. (2018)

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DOI: 10.1142/S0218001418540162

access: closed

type: Journal Article

metadata version: 2024-08-28

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  - https://dblp.org/rec/journals/ijprai/GuoLHWTHOZ18
Longyuan Guo, Shinan Li, Wenjing Hu, Jianhui Wu, Bing Tu, Wei He, Xianfeng Ou, Guoyun Zhang:
Sub-Pixel Level Defect Detection Based on Notch Filter and Image Registration. Int. J. Pattern Recognit. Artif. Intell. 32(6): 1854016:1-1854016:15 (2018)

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