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"Multifault and delay-fault testability of multilevel circuits."

Wuudiann Ke, Premachandran R. Menon (1995)

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DOI: 10.1007/BF00996442

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/KeM95
Wuudiann Ke, Premachandran R. Menon:
Multifault and delay-fault testability of multilevel circuits. J. Electron. Test. 6(3): 333-336 (1995)

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