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"Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS ..."

Takahiro Matsuda et al. (2023)

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DOI: 10.1109/ACCESS.2023.3252568

access: open

type: Journal Article

metadata version: 2023-03-28

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Takahiro Matsuda, Yoshiaki Nishikawa, Eiji Takahashi, Takeo Onishi, Toshiki Takeuchi:
Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification. IEEE Access 11: 22418-22429 (2023)

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