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"Double sampling data checking technique: an online testing solution for ..."

Yi Zhao, Sujit Dey, Li Chen (2004)

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DOI: 10.1109/TVLSI.2004.826197

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ZhaoDC04
Yi Zhao, Sujit Dey, Li Chen:
Double sampling data checking technique: an online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Trans. Very Large Scale Integr. Syst. 12(7): 746-755 (2004)

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