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"In-Situ Method for TSV Delay Testing and Characterization Using Input ..."

Jhih-Wei You et al. (2013)

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DOI: 10.1109/TVLSI.2012.2187543

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tvlsi/YouHLTKCW13
Jhih-Wei You, Shi-Yu Huang, Yu-Hsiang Lin, Meng-Hsiu Tsai, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 443-453 (2013)

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