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"Process variation effects on circuit performance: TCAD simulation of ..."

C. S. Murthy, M. Gall (1997)

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DOI: 10.1109/43.663828

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MurthyG97
C. S. Murthy, M. Gall:
Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs]. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(11): 1383-1389 (1997)

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