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"On the effects of test compaction on defect coverage."

Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara (1996)

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DOI: 10.1109/VTEST.1996.510889

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/ReddyPK96
Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara:
On the effects of test compaction on defect coverage. VTS 1996: 430-437

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