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"Identification of the White-Mold affected Soybean fields by using ..."

Sae-Han Suh et al. (2017)

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DOI: 10.1145/3129676.3129703

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-27

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  dblp key:
  - conf/racs/SuhKJBHS17
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  - https://dblp.org/rec/conf/racs/SuhKJBHS17
Sae-Han Suh, Dongyoun Kim, Ji-Eun Jhang, Emmanuel Byamukama, Gary Hatfield, Sung Y. Shin:
Identification of the White-Mold affected Soybean fields by using Multispectral Imageries, Spatial Autocorrelation and Support Vector Machine. RACS 2017: 104-109

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