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"How Circuit Analysis and Yield Optimization Can Be Used To Detect Circuit ..."

Carlo Roma et al. (2005)

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DOI: 10.1109/ISQED.2005.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/RomaDSPP05
Carlo Roma, Pierluigi Daglio, Guido De Sandre, Marco Pasotti, Marco Poles:
How Circuit Analysis and Yield Optimization Can Be Used To Detect Circuit Limitations Before Silicon Results. ISQED 2005: 107-112

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