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"Concurrent device/circuit aging for general reliability simulations."

Haoyuan Jiang et al. (2016)

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DOI: 10.1109/ISICIR.2016.7829708

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  dblp key:
  - conf/isicir/JiangMZC16
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  - https://dblp.org/rec/conf/isicir/JiangMZC16
Haoyuan Jiang, Chenyue Ma, Lining Zhang, Mansun Chan:
Concurrent device/circuit aging for general reliability simulations. ISIC 2016: 1-4

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