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"Test-driven development of consumer electronics device drivers: A ..."

Seehwan Yoo, Young-Pil Kim (2015)

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DOI: 10.1109/ICCE.2015.7066459

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-27

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Seehwan Yoo, Young-Pil Kim:
Test-driven development of consumer electronics device drivers: A user-level device driver approach. ICCE 2015: 392-394

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