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"MBIST Supported Multi Step Trim for Reliable eMRAM Sensing."

Jongsin Yun et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325218

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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  dblp key:
  - conf/itc/YunNKSDBG20
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  - https://dblp.org/rec/conf/itc/YunNKSDBG20
Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda:
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ITC 2020: 1-5

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