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"Delay-fault testing and defects in deep sub-micron ICs-does critical ..."

Will R. Moore et al. (2000)

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DOI: 10.1109/TEST.2000.894196

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/MooreGBL00
Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg:
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC 2000: 95-104

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