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"Wafer Level Stress: Enabling Zero Defect Quality for Automotive ..."

Chen He, Yanyao Yu (2020)

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DOI: 10.1109/ITC44778.2020.9325213

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Chen He, Yanyao Yu:
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. ITC 2020: 1-10

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