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"The AB-filling methodology for power-aware at-speed scan testing."

Tsung-Tang Chen et al. (2010)

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DOI: 10.1109/TEST.2010.5699299

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/ChenWCRT10
Tsung-Tang Chen, Po-Han Wu, Kung-Han Chen, Jiann-Chyi Rau, Shih-Ming Tzeng:
The AB-filling methodology for power-aware at-speed scan testing. ITC 2010: 807

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