default search action

combined dblp search
author search
venue search
publication search

ask others

"Comparison of modeling approaches for transistor degradation: model card ..."

André Lange et al. (2019)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2019.8901760

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/LangeGLC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/LangeGLC19
André Lange, Fabio A. Velarde Gonzalez, Insaf Lahbib, Sonja Crocoll:
Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits. ESSDERC 2019: 186-189

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.