default search action

combined dblp search
author search
venue search
publication search

ask others

"Improvement of reverse recovery characteristics through integration of ..."

Kang Zhang et al. (2023)

> Home

Details and statistics

DOI: 10.1145/3650400.3650668

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/eitce/Zhang0HJZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eitce/Zhang0HJZ23
Kang Zhang, Yu Wu, Dongqing Hu, Yunpeng Jia, Xintian Zhou:
Improvement of reverse recovery characteristics through integration of MOS-barrier Schottky diode in SiC superjunction structure. EITCE 2023: 1601-1608

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.