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"Application of defect injection flow for fault validation in memories."

K. Amirkhanyan et al. (2013)

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DOI: 10.1109/EWDTS.2013.6673197

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/ewdts/AmirkhanyanDHMSVZ13
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  persistent URL:
  - https://dblp.org/rec/conf/ewdts/AmirkhanyanDHMSVZ13
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Application of defect injection flow for fault validation in memories. EWDTS 2013: 1-4

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