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"Occurrence and Mitigation of Hot Carrier Degradation in Cryogenic MOSFET ..."

Shunsuke Shitakata et al. (2024)

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DOI: 10.1109/DRC61706.2024.10605331

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-16

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  - conf/drc/ShitakataOKIIAM24
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  - https://dblp.org/rec/conf/drc/ShitakataOKIIAM24
Shunsuke Shitakata, Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Takahiro Mori:
Occurrence and Mitigation of Hot Carrier Degradation in Cryogenic MOSFET Operation. DRC 2024: 1-2

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