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"Analyzing the Dynamics of Store Mechanism and Data Retention through ..."
Saikat Chakraborty, Jaydeep P. Kulkarni (2024)
- Saikat Chakraborty, Jaydeep P. Kulkarni:
Analyzing the Dynamics of Store Mechanism and Data Retention through Transient Simulations in Si/Ge TRAM for Cryogenic Memory Applications. DRC 2024: 1-2
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