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"FPGA-based failure mode testing and analysis for MLC NAND flash memory."

Meng Zhang et al. (2017)

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DOI: 10.23919/DATE.2017.7927029

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-31

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  dblp key:
  - conf/date/ZhangWHXZX17
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  persistent URL:
  - https://dblp.org/rec/conf/date/ZhangWHXZX17
Meng Zhang, Fei Wu, He Huang, Qian Xia, Jian Zhou, Changsheng Xie:
FPGA-based failure mode testing and analysis for MLC NAND flash memory. DATE 2017: 434-439

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