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"Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits."

S. M. Aziz, Joarder Kamruzzaman (1998)

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DOI: 10.1109/ATS.1998.741601

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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S. M. Aziz, Joarder Kamruzzaman:
Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits. Asian Test Symposium 1998: 119-

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