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Joachim Baumann 0003

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affiliation: Siemens AG, Munich, Germany

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2005
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Sven Krimmel, Joachim Baumann, Zoltán Kiss, Attila Kuba, Antal Nagy, Jürgen Stephan:
Discrete tomography for reconstruction from limited view angles in non-destructive testing. Electron. Notes Discret. Math. 20: 455-474 (2005)

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