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Zujun Wang
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2020 – today
- 2024
- [j9]Zujun Wang, Yuanyuan Xue, Ning Tang, Gang Huang, Xu Nie, Shan-Kun Lai, Baoping He, Wuying Ma, Jiangkun Sheng, Shilong Gou:
Synergistic Radiation Effects in PPD CMOS Image Sensors Induced by Neutron Displacement Damage and Gamma Ionization Damage. Sensors 24(5): 1441 (2024) - [j8]Zhuojun Chen
, Wenhao Yang, Jinghang Chen, Zujun Wang
Improving Radiation Reliability of SRAM-Based Physical Unclonable Function With Self-Healing and Pre-Irradiation Masking Techniques. IEEE Trans. Very Large Scale Integr. Syst. 32(2): 372-381 (2024) - 2023
- [j7]Wuying Ma, Xiaoping Ouyang, Hongxia Guo, Pei Li, Baoping He, Zujun Wang, Shilong Gou, Yuanyuan Xue:
Impact of thermal baking before radiation on the total dose response of bipolar device. Microelectron. J. 135: 105764 (2023)
2010 – 2019
- 2019
- [j6]Zujun Wang, Yuanyuan Xue, Wei Chen, Rui Xu, Hao Ning, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong:
Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors. Sci. China Inf. Sci. 62(6): 69403:1-69403:3 (2019) - 2018
- [j5]Yuanyuan Xue, Zujun Wang, Wei Chen, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin:
Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method. Sci. China Inf. Sci. 61(6): 062405:1-062405:10 (2018) - [j4]Wen Zhao
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. Microelectron. Reliab. 87: 151-157 (2018) - 2017
- [j3]Yuanyuan Xue, Zujun Wang, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin:
Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods. Sci. China Inf. Sci. 60(12): 120402:1-120402:3 (2017) - [j2]Yuanyuan Xue, Zujun Wang, Wei Chen, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin:
Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects. Sensors 17(12): 2781 (2017) - 2016
- [j1]Zujun Wang
Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage. J. Sensors 2016: 9604042:1-9604042:6 (2016)
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