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Yingchun Lu
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2020 – today
- 2024
- [j35]Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. J. Electron. Test. 40(3): 405-415 (2024) - [j34]Yu Chen, Huaguo Liang, Linghui Zhang, Liang Yao, Yingchun Lu:
High throughput dynamic dual entropy source true random number generator based on FPGA. Microelectron. J. 145: 106113 (2024) - [j33]Yingchun Lu, Bolin Sun, Enpu Xu, Changlong Cao, Linghui Zhang, Liang Yao:
High-throughput true random number generator based on a dual-input oscillation circuit. Microelectron. J. 151: 106367 (2024) - [j32]Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen:
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60(4): 4590-4600 (2024) - [j31]Shihao Yang, Huaguo Liang, Rong Hu, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Lightweight Hybrid Entropy Source True Random Number Generator Based on Jitter and Metastability. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3513-3517 (2024) - [j30]Tian Chen, Ruiyuan Ding, Jun Liu, Xiaohui Yuan, Yingchun Lu, Huaguo Liang, Siyuan Liu:
A Scan-Chain-Based Built-in Self-Test for ILV in Monolithic 3-D ICs. IEEE Trans. Instrum. Meas. 73: 1-13 (2024) - [j29]Jun Liu, Zhi Chen, Songren Cheng, Chen Xiang, Tian Chen, Xi Wu, Yingchun Lu, Huaguo Liang:
A Symmetric Bridge-Based Pre-Bond TSV Faults Detection Method. IEEE Trans. Instrum. Meas. 73: 1-10 (2024) - [c3]Zhengfeng Huang, Yankun Lin, Fansheng Zeng, Jingchang Bian, Zhao Yang, Huaguo Liang, Yingchun Lu, Liang Yao, Xiaoqing Wen, Tianming Ni:
PFO PUF: A Lightweight Parallel Feed Obfuscation PUF Resistant to Machine Learning Attacks. ITC-Asia 2024: 1-6 - 2023
- [j28]Yingchun Lu, Hongmin Li, Chun-Lai Li:
Electrical activity and synchronization of memristor synapse-coupled HR network based on energy method. Neurocomputing 544: 126246 (2023) - [j27]Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Design of approximate Booth multipliers based on error compensation. Integr. 90: 183-189 (2023) - [j26]Zhengfeng Huang, Zhouyu Gong, Dongxing Ma, Xiaolei Wang, Yingchun Lu, Wenfa Zhan, Huaguo Liang, Tianming Ni:
Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectron. J. 131: 105650 (2023) - [j25]Liyu Jin, Maoxiang Yi, Yuan Xiao, Lifa Sun, Yingchun Lu, Huaguo Liang:
A dynamically reconfigurable entropy source circuit for high-throughput true random number generator. Microelectron. J. 133: 105690 (2023) - [j24]Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138: 105841 (2023) - [j23]Liang Yao, Huaguo Liang, Yingchun Lu:
Low-overhead TRNG based on MUX for cryptographic protection using multiphase sampling. J. Supercomput. 79(15): 17170-17186 (2023) - [j22]Yingchun Lu, Yun Yang, Rong Hu, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang, Yuanming Ma, Tian Chen, Liang Yao:
High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Trans. Reconfigurable Technol. Syst. 16(4): 64:1-64:23 (2023) - 2022
- [j21]Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang:
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electron. Test. 38(1): 63-76 (2022) - [j20]Chen Tian, Jianyong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi:
A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integr. 87: 82-89 (2022) - [j19]Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu:
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput. 31(13): 2250231:1-2250231:17 (2022) - [j18]Wu Zhou, Yiming Ouyang, Yingchun Lu, Huaguo Liang:
A router architecture with dual input and dual output channels for Networks-on-Chip. Microprocess. Microsystems 90: 104464 (2022) - [j17]Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu:
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119: 105314 (2022) - [j16]Yiming Ouyang, Ruifeng Li, Chunlei Hu, Qi Wang, Yingchun Lu, Huaguo Liang:
Design of fully adaptive routing and hybrid VC allocation in wireless NOC. Microelectron. J. 120: 105338 (2022) - [j15]Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectron. J. 124: 105445 (2022) - [j14]Jianguo Cui, Maoxiang Yi, Di Cao, Liang Yao, Xinyu Wang, Huaguo Liang, Zhengfeng Huang, Haochen Qi, Tianming Ni, Yingchun Lu:
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1752-1756 (2022) - [j13]Chenglong Sun, Yiming Ouyang, Yingchun Lu:
DCBuf: a high-performance wireless network-on-chip architecture with distributed wireless interconnects and centralized buffer sharing. Wirel. Networks 28(2): 505-520 (2022) - [c2]Liang Yao, Huaguo Liang, Hong Zhang, Tianming Ni, Maoxiang Yi, Yingchun Lu:
A Lightweight M_TRNG Design based on MUX Cell Entropy using Multiphase Sampling. AsianHOST 2022: 1-4 - 2021
- [j12]Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu:
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems. J. Electron. Test. 37(4): 545-559 (2021) - [j11]Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu:
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81: 17-24 (2021) - [j10]Zhengfeng Huang, Zian Su, Tianming Ni, Qi Xu, Haochen Qi, Yingchun Lu, Manzi Eric, Hui Xu:
Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier. J. Circuits Syst. Comput. 30(5): 2120003:1-2120003:16 (2021) - [j9]Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yiming Ouyang, Tianming Ni, Zhenmin Li:
Design of node separated triple-node-upset self-recoverable latch. Microelectron. J. 114: 105111 (2021) - [j8]Zhengfeng Huang, Xiandong Li, Zhouyu Gong, Huaguo Liang, Yingchun Lu, Yiming Ouyang, Tianming Ni:
Design of MNU-Resilient latches based on input-split C-elements. Microelectron. J. 116: 105243 (2021) - [j7]Yuan Zhang, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectron. J. 117: 105263 (2021) - [j6]Xinyu Wang, Huaguo Liang, Yanjie Wang, Liang Yao, Yang Guo, Maoxiang Yi, Zhengfeng Huang, Haochen Qi, Yingchun Lu:
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Trans. Circuits Syst. I Regul. Pap. 68(2): 741-750 (2021) - [j5]Yingchun Lu, Xinyu Wang, Yanjie Wang, Yuan Zhang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Huaguo Liang:
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1922-1929 (2021) - 2020
- [j4]Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang:
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8: 108482-108490 (2020) - [j3]Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan:
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8: 147965-147972 (2020)
2010 – 2019
- 2018
- [c1]Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu:
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. ATS 2018: 59-62 - 2017
- [j2]Aibin Yan, Huaguo Liang, Yingchun Lu, Zhengfeng Huang:
A transient pulse dually filterable and online self-recoverable latch. IEICE Electron. Express 14(2): 20160911 (2017) - [j1]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi:
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14(12): 20170210 (2017)
Coauthor Index
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last updated on 2024-11-07 20:33 CET by the dblp team
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