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Maike Taddiken
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- affiliation: University of Bremen, Germany
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2020 – today
- 2024
- [c14]Marko S. Andjelkovic, Nebojsa Maletic, Nicola Miglioranza, Milos Krstic, Enrico Koeck, Jan Buchholz, Maike Taddiken, Markus Fehrenz, Shaden Baradie, Dirk Wübben, Markus Breitbach:
6G-TakeOff: Holistic 3D Networks for 6G Wireless Communications. DSD 2024: 435-442
2010 – 2019
- 2019
- [c13]Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Charge-Based Model for Reliability Analysis Flow of Flip- Flops under Process Variation and Aging. SMACD 2019: 233-236 - 2018
- [j2]Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen:
Design for reliability of generic sensor interface circuits. Microelectron. Reliab. 80: 184-197 (2018) - [c12]Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
LUT-Based Stochastic Modeling for Non-Normal Performance Distributions. SMACD 2018: 1-217 - [c11]Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability. SMACD 2018: 65-68 - [c10]Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
ReSeMBleD-Methods for Response Surface Model Behavioral Description. SMACD 2018: 157-160 - [c9]Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. VTS 2018: 1-6 - 2017
- [c8]Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Behavioral modeling of a sensor interface circuit including various non-idealities. SMACD 2017: 1-4 - [c7]Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components. SMACD 2017: 1-4 - 2016
- [j1]Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Analysis of aging effects - From transistor to system level. Microelectron. Reliab. 67: 64-73 (2016) - [c6]Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. IOLTS 2016: 121-125 - [c5]Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen:
Online monitoring of NBTI and HCD in beta-multiplier circuits. IOLTS 2016: 209-210 - [c4]Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul
, Dagmar Peters-Drolshagen:
Parameter identification for behavioral modeling of analog components including degradation. MIXDES 2016: 336-340 - [c3]Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process. MIXDES 2016: 353-358 - [c2]Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. MIXDES 2016: 363-368 - 2014
- [c1]Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul
Analog behavioral modeling for age-dependent degradation of complex analog circuits. MIXDES 2014: 317-322
Coauthor Index
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