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Ehrenfried Seebacher
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2010 – 2019
- 2017
- [c3]Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti
, Nezam Rohbani, C. Ma, Hans Jürgen Mattausch, A. Schiffmann, Alexander Steinmair, Ehrenfried Seebacher:
Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. ESSDERC 2017: 192-195 - 2016
- [j4]Hao Zou
Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(12): 2323-2333 (2016) - [c2]Yasser Moursy, Hao Zou, Ramy Iskander, Pierre Tisserand, Dieu-My Ton, Giuseppe Pasetti, Ehrenfried Seebacher, Alexander Steinmair, Thomas Gneiting, Heidrun Alius:
Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs. DATE 2016: 265-268 - [c1]Camillo Stefanucci, Pietro Buccella, Ehrenfried Seebacher, Alexander Steinmair, Maher Kayal, Jean-Michel Sallese:
Analysis of substrate currents propagation in HVCMOS technology. ESSDERC 2016: 319-322 - 2011
- [j3]Stanislav Tyaginov, Ivan A. Starkov
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51(9-11): 1525-1529 (2011) - 2010
- [j2]Stanislav Tyaginov, Ivan A. Starkov
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50(9-11): 1267-1272 (2010)
2000 – 2009
- 2008
- [j1]Martin Schrems, Martin Knaipp, Hubert Enichlmair, Verena Vescoli, Rainer Minixhofer, Ehrenfried Seebacher, Friedrich Peter Leisenberger, Ewald Wachmann, Gregor Schatzberger, Heimo Gensinger:
Scalable High Voltage CMOS technology for Smart Power and sensor applications. Elektrotech. Informationstechnik 125(4): 109-117 (2008)
Coauthor Index
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