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Etienne Auvray
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2020 – today
- 2023
- [j4]Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury:
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. J. Electron. Test. 39(2): 171-187 (2023) - 2021
- [c6]Tommaso Melis, Emmanuel Simeu, Luc Saury, Etienne Auvray:
Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits. ITC 2021: 243-250 - [c5]Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury:
Improved Fault Diagnosis of Analog Circuits using Light Emission Measures. LATS 2021: 1-6 - 2020
- [c4]Tommaso Melis, Emmanuel Simeu, Etienne Auvray:
Automatic Fault Simulators for Diagnosis of Analog Systems. IOLTS 2020: 1-6
2010 – 2019
- 2019
- [c3]Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar:
Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. IOLTS 2019: 21-26 - 2018
- [j3]Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray:
Scan-Chain Intra-Cell Aware Testing. IEEE Trans. Emerg. Top. Comput. 6(2): 278-287 (2018) - 2017
- [j2]Etienne Auvray, Paul Armagnat, Luc Saury, Maheshwaran Jothi, Michael Brügel:
Effective scan chain failure analysis method. Microelectron. Reliab. 76-77: 201-213 (2017) - 2014
- [j1]Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Etienne Auvray:
Intra-Cell Defects Diagnosis. J. Electron. Test. 30(5): 541-555 (2014) - [c2]Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Etienne Auvray:
On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS 2014: 312-317 - 2013
- [c1]Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray:
Effect-cause intra-cell diagnosis at transistor level. ISQED 2013: 460-467
Coauthor Index
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