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Sam D. Huynh

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2000 – 2009

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2001
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Mani Soma, Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg:
Hierarchical ATPG for Analog Circuits and Systems. IEEE Des. Test Comput. 18(1): 72-81 (2001)

1990 – 1999

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1999
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Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh:
Test set selection for structural faults in analog IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7): 1026-1039 (1999)
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Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma:
Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. Asian Test Symposium 1999: 239-
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Jinyan Zhang, Sam D. Huynh, Mani Soma:
A Test Point Insertion Algorithm for Mixed-Signal Circuits. VTS 1999: 319-325
1998
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Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang:
Dynamic Test Set Generation for Analog Circuits and Systems. Asian Test Symposium 1998: 360-365
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Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang:
Testability analysis and multi-frequency ATPG for analog circuits and systems. ICCAD 1998: 376-383

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