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Arturo J. Fernández
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2020 – today
- 2023
- [j33]Arturo J. Fernández
:
Optimal Confidence Regions for Weibull Parameters and Quantiles under Progressive Censoring. Algorithms 16(9): 427 (2023) - [j32]Arturo J. Fernández
Tolerance Limits and Sample-Size Determination Using Weibull Trimmed Data. Axioms 12(4): 351 (2023) - [j31]Arturo J. Fernández
Optimum lot inspection based on lognormal reliability tests. Int. J. Prod. Res. 61(5): 1424-1435 (2023) - [j30]Carlos J. Pérez-González
Optimal repetitive reliability inspection of manufactured lots for lifetime models using prior information. Int. J. Prod. Res. 61(7): 2214-2230 (2023) - [j29]Arturo J. Fernández
Overdispersion Effects on Reliability Test Planning. IEEE Trans. Reliab. 72(3): 1053-1063 (2023) - 2022
- [j28]Arturo J. Fernández
Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios. Axioms 11(11): 604 (2022) - [j27]Arturo J. Fernández
Planning reliability demonstration tests with limited expected risks. Comput. Ind. Eng. 165: 107918 (2022) - [j26]S. F. Bagheri, Akbar Asgharzadeh
Joint Prediction for Future Failures Times Under Type-II Censoring. IEEE Trans. Reliab. 71(1): 100-110 (2022) - [j25]Arturo J. Fernández
Gamma Reliability Test Times With Minimal Costs and Limited Risks. IEEE Trans. Reliab. 71(2): 555-563 (2022) - 2021
- [j24]Arturo J. Fernández
Optimal durations of Weibull reliability tests based on failure counts. Comput. Ind. Eng. 156: 107247 (2021) - [j23]Arturo J. Fernández
Optimal lot sentencing based on defective counts and prior acceptability. J. Comput. Appl. Math. 388: 113317 (2021) - 2020
- [j22]Arturo J. Fernández
Explicit lot inspection by attributes using minimal prior information. Comput. Ind. Eng. 148: 106743 (2020) - [j21]Arturo J. Fernández
Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design. Eur. J. Oper. Res. 286(2): 576-587 (2020) - [j20]Carlos J. Pérez-González
Efficient truncated repetitive lot inspection using Poisson defect counts and prior information. Eur. J. Oper. Res. 287(3): 964-974 (2020)
2010 – 2019
- 2019
- [j19]Arturo J. Fernández
Optimal attribute sampling plans in closed-forms. Comput. Ind. Eng. 137 (2019) - [j18]Arturo J. Fernández
Improved time-censored reliability test plans for k-out-of-n gamma systems. J. Comput. Appl. Math. 361: 42-54 (2019) - 2017
- [j17]Arturo J. Fernández
Economic lot sampling inspection from defect counts with minimum conditional value-at-risk. Eur. J. Oper. Res. 258(2): 573-580 (2017) - 2015
- [j16]Arturo J. Fernández
Optimal schemes for resubmitted lot acceptance using previous defect count data. Comput. Ind. Eng. 87: 66-73 (2015) - [j15]Arturo J. Fernández
Optimum attributes component test plans for k-out-of-n: F Weibull systems using prior information. Eur. J. Oper. Res. 240(3): 688-696 (2015) - 2014
- [j14]Arturo J. Fernández
Computing optimal confidence sets for Pareto models under progressive censoring. J. Comput. Appl. Math. 258: 168-180 (2014) - [j13]Arturo J. Fernández
Optimal Defects-Per-Unit Acceptance Sampling Plans Using Truncated Prior Distributions. IEEE Trans. Reliab. 63(2): 634-645 (2014) - 2013
- [j12]Arturo J. Fernández
Smallest Pareto confidence regions and applications. Comput. Stat. Data Anal. 62: 11-25 (2013) - [j11]Carlos J. Pérez-González
Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis. Comput. Stat. 28(3): 1333-1350 (2013) - 2012
- [j10]Arturo J. Fernández
Optimal acceptance sampling plans for log-location-scale lifetime models using average risks. Comput. Stat. Data Anal. 56(3): 719-731 (2012) - [j9]Arturo J. Fernández
Minimizing the area of a Pareto confidence region. Eur. J. Oper. Res. 221(1): 205-212 (2012) - [j8]Arturo J. Fernández
Generalized beta prior models on fraction defective in reliability test planning. J. Comput. Appl. Math. 236(13): 3147-3159 (2012) - 2011
- [j7]Arturo J. Fernández
Design of progressively censored group sampling plans for Weibull distributions: An optimization problem. Eur. J. Oper. Res. 211(3): 525-532 (2011) - [j6]Arturo J. Fernández
Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed Components. IEEE Trans. Reliab. 60(4): 833-844 (2011) - 2010
- [j5]Arturo J. Fernández
Two-sided tolerance intervals in the exponential case: Corrigenda and generalizations. Comput. Stat. Data Anal. 54(1): 151-162 (2010) - [j4]Arturo J. Fernández
Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes. IEEE Trans. Reliab. 59(2): 331-337 (2010)
2000 – 2009
- 2008
- [j3]Arturo J. Fernández
Reliability inference and sample-size determination under double censoring for some two-parameter models. Comput. Stat. Data Anal. 52(7): 3426-3440 (2008) - 2006
- [j2]Arturo J. Fernández
Bounding maximum likelihood estimates based on incomplete ordered data. Comput. Stat. Data Anal. 50(8): 2014-2027 (2006) - [j1]Arturo J. Fernández
Bayesian estimation based on trimmed samples from Pareto populations. Comput. Stat. Data Anal. 51(2): 1119-1130 (2006)
Coauthor Index
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