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Jordi Suñé
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2020 – today
- 2021
- [c3]Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, N. Gomez, Enrique Miranda, Jordi Suñé:
Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. LASCAS 2021: 1-4 - 2020
- [j16]Fernando Leonel Aguirre, Sebastián Matías Pazos, Felix Palumbo, Jordi Suñé, Enrique Miranda:
Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. IEEE Access 8: 202174-202193 (2020)
2010 – 2019
- 2018
- [j15]German Agustin Patterson, Jordi Suñé, Enrique Miranda:
SPICE simulation of memristive circuits based on memdiodes with sigmoidal threshold functions. Int. J. Circuit Theory Appl. 46(1): 39-49 (2018) - [j14]Alberto Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda:
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Microelectron. Reliab. 88-90: 142-146 (2018) - 2017
- [j13]Alberto Rodriguez-Fernandez, Carlo Cagli, Luca Perniola, Jordi Suñé, Enrique Miranda:
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis. Microelectron. Reliab. 76-77: 178-183 (2017) - [j12]German Agustin Patterson, Jordi Suñé, Enrique Miranda:
Voltage-Driven Hysteresis Model for Resistive Switching: SPICE Modeling and Circuit Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2044-2051 (2017) - [c2]Enrique Miranda, Jordi Suñé, Chengbin Pan, Marco A. Villena, Na Xiao, Mario Lanza:
Equivalent circuit model for the electron transport in 2D resistive switching material systems. ESSDERC 2017: 86-89 - 2015
- [j11]Juli Blasco, Nestor Fabian Ghenzi, Jordi Suñé, Pablo Levy, Enrique Miranda:
Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films. Microelectron. Reliab. 55(1): 1-14 (2015) - [j10]Alberto Rodriguez-Fernandez, M. B. González, Francesca Campabadal, Jordi Suñé, Enrique Miranda:
Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates. Microelectron. Reliab. 55(9-10): 1442-1445 (2015) - [c1]Juli Blasco, Jordi Suñé, Enrique Miranda:
Modeling of the conduction characteristics of voltage-driven bipolar RRAMs including turning point effects. ESSDERC 2015: 44-47 - 2014
- [j9]Juli Blasco, Helena Castán, Héctor García, Salvador Dueñas, Jordi Suñé, Marianna Kemell, Kaupo Kukli, Mikko Ritala, Markku Leskelä, Enrique Miranda:
Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors. Microelectron. Reliab. 54(9-10): 1707-1711 (2014) - 2013
- [j8]X. Saura, D. Moix, Jordi Suñé, Paul K. Hurley, Enrique Miranda:
Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress. Microelectron. Reliab. 53(9-11): 1257-1260 (2013) - [j7]X. Saura, X. Lian, David Jiménez, Enrique Miranda, Xavier Borrisé, Francesca Campabadal, Jordi Suñé:
Field-effect control of breakdown paths in HfO2 based MIM structures. Microelectron. Reliab. 53(9-11): 1346-1350 (2013) - 2012
- [j6]Enrique Miranda, Takamasa Kawanago, Kuniyuki Kakushima, Jordi Suñé, Hiroshi Iwai:
Analysis and modeling of the gate leakage current in advanced nMOSFET devices with severe gate-to-drain dielectric breakdown. Microelectron. Reliab. 52(9-10): 1909-1912 (2012)
2000 – 2009
- 2005
- [j5]Ernest Y. Wu, Jordi Suñé:
Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability. Microelectron. Reliab. 45(12): 1809-1834 (2005) - 2004
- [j4]Enrique Miranda, Jordi Suñé:
Electron transport through broken down ultra-thin SiO2 layers in MOS devices. Microelectron. Reliab. 44(1): 1-23 (2004) - 2003
- [j3]Ernest Y. Wu, Jordi Suñé, Wing L. Lai, Alex Vayshenker, Edward J. Nowak, David L. Harmon:
Critical reliability challenges in scaling SiO2-based dielectric to its limit. Microelectron. Reliab. 43(8): 1175-1184 (2003) - [j2]Jordi Suñé, Ernest Y. Wu, David Jiménez, Wing L. Lai:
Statistics of soft and hard breakdown in thin SiO2 gate oxides. Microelectron. Reliab. 43(8): 1185-1192 (2003) - 2001
- [j1]Xavier Oriols, Jordi Suñé:
Study of Electronic Transport in Tunneling Devices Using an Incoherent Superposition of Time Dependent Wave Packets. VLSI Design 13(1-4): 145-148 (2001)
Coauthor Index
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