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Giovanna Mura
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2020 – today
- 2023
- [j29]Giorgio Montisci
, Giovanna Mura
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films. IEEE Access 11: 839-848 (2023)
2010 – 2019
- 2018
- [j28]Giovanna Mura
Reliability concerns from the gray market. Microelectron. Reliab. 88-90: 26-30 (2018) - [j27]Massimo Vanzi
Further improvements of an extended Hakki-Paoli method. Microelectron. Reliab. 88-90: 859-863 (2018) - 2017
- [j26]Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. Microelectron. Reliab. 76-77: 438-443 (2017) - [j25]Massimo Vanzi, Giulia Marcello, Giovanna Mura
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. 76-77: 579-583 (2017) - 2016
- [j24]Roberta Pilia, Guillaume Bascoul
Single Event Transient acquisition and mapping for space device Characterization. Microelectron. Reliab. 64: 73-78 (2016) - [j23]Massimo Vanzi, Giovanna Mura
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64: 617-622 (2016) - 2015
- [j22]Massimo Vanzi, Giovanna Mura
Clamp voltage and ideality factor in laser diodes. Microelectron. Reliab. 55(9-10): 1736-1740 (2015) - [c1]Marco Barbato
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS 2015: 3 - 2014
- [j21]Giovanna Mura
FIB-induced electro-optical alterations in a DFB InP laser diode. Microelectron. Reliab. 54(9-10): 2151-2153 (2014) - 2013
- [j20]Matteo Dal Lago, Matteo Meneghini
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53(9-11): 1524-1528 (2013) - [j19]Massimo Vanzi, Giovanna Mura
Optical losses in single-mode laser diodes. Microelectron. Reliab. 53(9-11): 1529-1533 (2013) - [j18]Giovanna Mura
The role of the optical trans-characteristics in laser diode analysis. Microelectron. Reliab. 53(9-11): 1538-1542 (2013) - [j17]Alessandro Compagnin, Matteo Meneghini
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013) - 2012
- [j16]Matteo Meneghini
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52(5): 804-812 (2012) - [j15]Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, Giovanna Mura
MIM capacitor-related early-stage field failures. Microelectron. Reliab. 52(9-10): 2073-2076 (2012) - [j14]Matteo Dal Lago, Matteo Meneghini
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52(9-10): 2164-2167 (2012) - 2011
- [j13]Massimo Vanzi, Giovanna Mura
DC parameters for laser diodes from experimental curves. Microelectron. Reliab. 51(9-11): 1752-1756 (2011) - 2010
- [j12]Giovanna Mura
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectron. Reliab. 50(4): 471-478 (2010)
2000 – 2009
- 2009
- [j11]Giovanna Mura
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49(9-11): 1196-1199 (2009) - 2008
- [j10]Giovanna Mura
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48(8-9): 1208-1211 (2008) - 2007
- [j9]Matteo Meneghini
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47(9-11): 1625-1629 (2007) - 2006
- [j8]G. Cassanelli, Giovanna Mura
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46(9-11): 1795-1799 (2006) - 2005
- [j7]G. Cassanelli, Giovanna Mura
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005) - 2004
- [j6]Giovanna Mura
Failure analysis of RFIC amplifiers. Microelectron. Reliab. 44(9-11): 1599-1604 (2004) - 2003
- [j5]Gaudenzio Meneghesso
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43(9-11): 1737-1742 (2003) - [j4]Giovanna Mura
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43(9-11): 1771-1776 (2003) - 2002
- [j3]Gaudenzio Meneghesso, A. Cocco, Giovanna Mura
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002) - [j2]Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42(9-11): 1303-1306 (2002) - [j1]M. Giglio, G. Martines, Giovanna Mura
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42(9-11): 1311-1315 (2002)
Coauthor Index
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