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Vincent Pouget
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2020 – today
- 2020
- [c9]S. Guagliardo, Frederic Wrobel
, Ygor Q. Aguiar
Effect of Temperature on Single Event Latchup Sensitivity. DTIS 2020: 1-5 - [c8]Israel C. Lopes, Vincent Pouget, Frederic Wrobel
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS 2020: 1-6
2010 – 2019
- 2019
- [j24]Gennaro Severino Rodrigues
Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection. J. Electron. Test. 35(3): 367-381 (2019) - 2018
- [j23]Ygor Q. Aguiar
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018) - [c7]Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio:
Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications. IOLTS 2018: 291-294 - [c6]Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio:
Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection. LATS 2018: 1-6 - [c5]Fabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech:
Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods. SBCCI 2018: 1-6 - 2017
- [j22]Frederic Wrobel
A calculation method to estimate single event upset cross section. Microelectron. Reliab. 76-77: 644-649 (2017) - [j21]Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. 76-77: 650-654 (2017) - 2013
- [j20]Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis:
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53(9-11): 1315-1319 (2013) - [j19]I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu:
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53(9-11): 1325-1328 (2013) - 2012
- [j18]R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis:
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52(9-10): 1816-1821 (2012) - [j17]Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52(9-10): 2035-2038 (2012) - 2011
- [j16]Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis:
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51(9-11): 1658-1661 (2011)
2000 – 2009
- 2009
- [j15]C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart:
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49(9-11): 1143-1147 (2009) - [j14]Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget:
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49(9-11): 1175-1181 (2009) - 2008
- [j13]Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely:
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48(8-9): 1333-1338 (2008) - [c4]Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco:
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS 2008: 295-301 - 2007
- [j12]V. Maingot, Jean Baptiste Ferron, Régis Leveugle, Vincent Pouget, Alexandre Douin:
Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results. Microelectron. Reliab. 47(9-11): 1836-1840 (2007) - 2006
- [j11]Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46(9-11): 1514-1519 (2006) - [j10]Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis:
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46(9-11): 1563-1568 (2006) - 2005
- [j9]Nicolas Guitard, Fabien Essely, David Trémouilles
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45(9-11): 1415-1420 (2005) - [c3]Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13 - 2004
- [j8]Vincent Pouget, Dean Lewis, Pascal Fouillat:
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53(4): 1227-1231 (2004) - [j7]Angie Tetelin, Vincent Pouget, Jean-Luc Lachaud, Claude Pellet
Dynamic behavior of a chemical sensor for humidity level measurement in human breath. IEEE Trans. Instrum. Meas. 53(4): 1262-1267 (2004) - 2003
- [j6]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j5]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j4]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - [j3]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - 2002
- [c2]Dean Lewis, Pascal Fouillat, Vincent Pouget:
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW 2002: 109-113 - 2001
- [j2]Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001) - [j1]Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner:
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41(9-10): 1513-1518 (2001) - 2000
- [c1]Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
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