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Chryssa Dislis
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2000 – 2009
- 2002
- [c11]Chryssa Dislis:
Improving Service Availability via Low-Outage Upgrades. COMPSAC 2002: 989-993 - 2001
- [c10]Deirdre Donovan, Chryssa Dislis, Ray Murphy, Stephen Unger, Christina Kenneally, Janet Young, Liz Sheehan:
Incorporating Software Reliability Engineering into the Test Process for an Extensive GUI-Based Network Management System. ISSRE 2001: 44-53
1990 – 1999
- 1999
- [c9]Norma Barrett, Simon Martin, Chryssa Dislis:
Test process optimization: closing the gap in the defect spectrum. ITC 1999: 124-129 - [c8]Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren:
The evolution of a system test process [for Motorola GSM products]. ITC 1999: 680-688 - 1998
- [j5]David E. Schimmel, Chryssa Dislis:
Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. IEEE Des. Test Comput. 15(3): 8-9 (1998) - [j4]William S. Harwin
, Lee O. Leiber, Gregory P. G. Austwick, Chryssa Dislis:
Clinical potential and design of programmable mechanical impedances for orthotic applications. Robotica 16(5): 523-530 (1998) - [c7]Chryssa Dislis, Gerry Musgrave, Roger B. Hughes:
Formal Design Techniques - Theory and Engineering Reality. Asian Test Symposium 1998: 394-398 - 1996
- [c6]Chryssa Dislis, Ian P. Jalowiecki:
Economics Modelling and Optimisation of MCM Test Strategies. ED&TC 1996: 615 - 1995
- [c5]Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki:
MCM Quality and Cost Analysis Using Economics Models. ITC 1995: 430-437 - 1994
- [j3]I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick:
Test strategy planning using economic analysis. J. Electron. Test. 5(2-3): 137-155 (1994) - [j2]J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler:
Sensitivity analysis in economics based test strategy planning. J. Electron. Test. 5(2-3): 239-251 (1994) - 1993
- [c4]Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick:
Economics in Design and Test. ICCD 1993: 384-387 - [c3]Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler:
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC 1993: 210-217 - [c2]Chryssa Dislis, J. H. Dick, Anthony P. Ambler:
Algorithms for Cost Optimised Test Strategy Selection. ITC 1993: 383-391 - 1991
- [j1]I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick:
Economic Effects in Design and Test. IEEE Des. Test Comput. 8(4): 64-77 (1991)
1980 – 1989
- 1989
- [c1]Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler:
Cost Analysis of Test Method Environments. ITC 1989: 875-883
Coauthor Index
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