default search action
Tong-Yu Hsieh
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2024
- [c31]Jun-Tsung Wu, Hideyuki Ichihara, Tomoo Inoue, Tong-Yu Hsieh:
On Accuracy Enhancement of No-Reference Error-Tolerability Testing for Images in Object Detection Applications Based on RGB Channel Characteristics. ITC-Asia 2024: 1-6 - 2023
- [j18]Tong-Yu Hsieh
, Chun-Chao Cheng, Wei-Ji Chao
On Development of Reliable Machine Learning Systems Based on Machine Error Tolerance of Input Images. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1323-1335 (2023) - [c30]Wei-Ji Chao, Tong-Yu Hsieh:
Cost-Effective Error-Mitigation for High Memory Error Rate of DNN: A Case Study on YOLOv4. ITC-Asia 2023: 1-6 - 2022
- [c29]Tong-Yu Hsieh, Pao-Wei Tsui, Jun-Tsung Wu:
On No-Reference Error Detection of an Image Stitching System Based on Error-Tolerance. ATS 2022: 150-155 - 2021
- [c28]Tong-Yu Hsieh, Jun-Tsung Wu:
Investigation on Error-Tolerability Enhancement of Videos via Re-Encoding for Computer Vision: A Case Study on Object Detection. ICCE-TW 2021: 1-2 - [c27]Chih-Hao Wang, Natalia Lylina, Ahmed Atteya, Tong-Yu Hsieh, Hans-Joachim Wunderlich:
Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. IOLTS 2021: 1-7 - 2020
- [j17]Chih-Hao Wang, Tong-Yu Hsieh:
An Implication-based Test Scheme for Both Diagnosis and Concurrent Error Detection Applications. ACM Trans. Design Autom. Electr. Syst. 25(1): 3:1-3:27 (2020) - [c26]Tong-Yu Hsieh, Chen-Chia Chung, Jun-Tsung Wu:
On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion. ITC-Asia 2020: 136-141 - [c25]Tong-Yu Hsieh, Yu-Min Chung:
A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises. ITC-Asia 2020: 142-147 - [c24]Tong-Yu Hsieh, Hsin-Yung Shen, Chia-Teng Hsu:
Cost-Effective Reliable Edge Computing Hardware Design Based on Module Simplification and Duplication: A Case Study on Vehicle Detection Based on Support Vector Machine. VLSI-DAT 2020: 1-4 - [c23]Tong-Yu Hsieh, Pin-Xuan Wu, Chun-Chao Cheng:
On Classification of Acceptable Images for Reliable Artificial Intelligence Systems: A Case Study on Pedestrian Detection. VTS 2020: 1-6
2010 – 2019
- 2019
- [c22]Tong-Yu Hsieh, Yuan-Cheng Lin, Hsin-Yung Shen:
On Automatic Generation of Training Images for Machine Learning in Automotive Applications. AICAS 2019: 225-228 - [c21]Tong-Yu Hsieh, Kuang-Chun Lin, Hsin-Hsien Lin:
A Delay-Aware Implementation Scheme for Cost-Effective Implication-Based Concurrent Error Detection. ITC-Asia 2019: 145-150 - 2018
- [j16]Tong-Yu Hsieh
Structural Variance-Based Error-Tolerability Test Method for Image Processing Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 485-498 (2018) - [j15]Chih-Hao Wang
On Probability of Detection Lossless Concurrent Error Detection Based on Implications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 1090-1103 (2018) - [c20]Tong-Yu Hsieh, Shang-En Chan, Chi-Hsuan Ho:
On no-reference on-line error-tolerability testing for videos. ETS 2018: 1-2 - [c19]Chih-Hao Wang, Chi-Hsuan Ho, Tong-Yu Hsieh:
Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection. ITC-Asia 2018: 127-132 - [c18]Tong-Yu Hsieh, Chao-Ru Chen:
A No-Reference Error-Tolerability Test Methodology for Image Processing Applications. ITC-Asia 2018: 133-138 - 2017
- [j14]Tong-Yu Hsieh, Kuan-Hsien Li, Chen-Chia Chung:
A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications. Microelectron. J. 66: 48-57 (2017) - [j13]Tong-Yu Hsieh
Cost-Effective Enhancement on Both Yield and Reliability for Cache Designs Based on Performance Degradation Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 25(9): 2434-2448 (2017) - [c17]Tong-Yu Hsieh, Tai-Ang Cheng, Chao-Ru Chen:
Error-Tolerability Evaluation and Test for Images in Face Detection Applications. ATS 2017: 206-211 - [c16]Chih-Hao Wang, Tong-Yu Hsieh:
A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability. ITC-Asia 2017: 52-57 - 2016
- [j12]Tong-Yu Hsieh, Tai-Ping Wang, Shuo Yang, Chin-An Hsu, Yi-Lung Lin:
An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing. IEICE Trans. Electron. 99-C(3): 404-414 (2016) - [j11]Tong-Yu Hsieh, Chih-Hao Wang, Tsung-Liang Chih, Ya-Hsiu Chi:
A Performance Degradation Tolerable Cache Design by Exploiting Memory Hierarchies. IEEE Trans. Very Large Scale Integr. Syst. 24(2): 784-788 (2016) - 2015
- [j10]Tong-Yu Hsieh, Chih-Hao Wang, Chun-Wei Kuo, Shu-Yu Huang, Tsung-Liang Chih:
Performance Degradation Tolerance Analysis and Design for Effective Yield Enhancement. J. Electron. Test. 31(5-6): 427-441 (2015) - [c15]Tong-Yu Hsieh, Yi-Han Peng:
Filtering-based error-tolerability evaluation of image processing circuits. IOLTS 2015: 132-137 - 2014
- [j9]Wei-Cheng Lien
Efficient LFSR Reseeding Based on Internal-Response Feedback. J. Electron. Test. 30(6): 673-685 (2014) - [j8]Tong-Yu Hsieh, Yi-Han Peng, Kuan-Hsien Li:
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation. J. Electron. Test. 30(6): 687-699 (2014) - [c14]Wei-Cheng Lien
Output-bit selection with X-avoidance using multiple counters for test-response compaction. ETS 2014: 1-6 - [c13]Tong-Yu Hsieh, Kuan-Hsien Li, Yi-Han Peng:
On efficient error-tolerability evaluation and maximization for image processing applications. VLSI-DAT 2014: 1-4 - [c12]Wei-Cheng Lien
Output selection for test response compaction based on multiple counters. VLSI-DAT 2014: 1-4 - 2013
- [j7]Wei-Cheng Lien
Counter-Based Output Selection for Test Response Compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(1): 152-164 (2013) - [j6]Wei-Cheng Lien
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(8): 1254-1264 (2013) - [c11]Wei-Cheng Lien
A New LFSR Reseeding Scheme via Internal Response Feedback. Asian Test Symposium 2013: 97-102 - [c10]Tong-Yu Hsieh, Yi-Han Peng, Chia-Chi Ku:
An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance. Asian Test Symposium 2013: 289-294 - 2012
- [j5]Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer:
Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 754-764 (2012) - [c9]Tong-Yu Hsieh, Chia-Chi Ku, Chia-Hung Yeh:
A yield and reliability enhancement framework for image processing applications. APCCAS 2012: 683-686 - [c8]Wei-Cheng Lien
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. Asian Test Symposium 2012: 278-283 - [c7]Wei-Cheng Lien
Accumulator-based output selection for test response compaction. ISCAS 2012: 2313-2316 - [c6]Wei-Cheng Lien
Routing-efficient implementation of an internal-response-based BIST architecture. VLSI-DAT 2012: 1-4 - 2011
- [j4]Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(6): 930-934 (2011) - [j3]Kuen-Jong Lee, Wei-Cheng Lien
Test Response Compaction via Output Bit Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(10): 1534-1544 (2011) - 2010
- [j2]Kuen-Jong Lee, Tong-Yu Hsieh, Chin-Yao Chang, Yu-Ting Hong, Wen-Cheng Huang:
On-Chip SOC Test Platform Design Based on IEEE 1500 Standard. IEEE Trans. Very Large Scale Integr. Syst. 18(7): 1134-1139 (2010)
2000 – 2009
- 2009
- [c5]Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram
Tolerance of performance degrading faults for effective yield improvement. ITC 2009: 1-10 - 2008
- [j1]Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error Rate Based Test Methodology to Support Error-Tolerance. IEEE Trans. Reliab. 57(1): 204-214 (2008) - 2007
- [c4]Tong-Yu Hsieh, Kuen-Jong Lee, Jian-Jhih You:
Test Efficiency Analysis and Improvement of SOC Test Platforms. ATS 2007: 463-466 - [c3]Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
Reduction of detected acceptable faults for yield improvement via error-tolerance. DATE 2007: 1599-1604 - 2006
- [c2]Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. VTS 2006: 130-135 - 2005
- [c1]Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer:
A novel test methodology based on error-rate to support error-tolerance. ITC 2005: 9
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-15 20:43 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: