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Changchun Chai
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2020 – today
- 2023
- [j15]Kexu Chen
, Di Li
An Improved MOS Self-Biased Ring Amplifier and Modified Auto-Zeroing Scheme. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 606-610 (2023) - 2022
- [j14]Boqi Song, Changchun Chai, Fuxing Li, Chanrong Jiang, Yintang Yang:
Two novel PSRR enhancement techniques for voltage reference of depletion NMOS. IEICE Electron. Express 19(8): 20220009 (2022) - 2021
- [j13]Hanxiang Wang, Changchun Chai, Yuqian Liu, Han Wu, Wei Zhang, Fuxing Li, Yintang Yang:
Damage effects and mechanism of GaAs solar cells induced by high-power microwaves. IEICE Electron. Express 18(5): 20210020 (2021) - [j12]Qingshan Liu
An Optimization Method of Carrier Suppression for UHF RFID. J. Circuits Syst. Comput. 30(7): 2150111:1-2150111:11 (2021) - 2020
- [j11]Chanrong Jiang, Changchun Chai, Yi Yang, Yuqian Liu, Yintang Yang:
An IAOT controlled current-mode buck converter with RC-based inductor current sensor. IEICE Electron. Express 17(4): 20190757 (2020) - [j10]Chanrong Jiang, Changchun Chai, Yi Yang, Yintang Yang:
A high-linearity capacitance-to-digital converter with capacitive offset cancellation technique. IEICE Electron. Express 17(18): 20200268 (2020)
2010 – 2019
- 2019
- [j9]Qingshan Liu, Changchun Chai, Yuqian Liu:
A new method to improve the phase noise performance of the frequency synthesizer for UHF RFID. IEICE Electron. Express 16(5): 20181151 (2019) - [j8]Runyun Miao, Changchun Chai, Yuqian Liu, Hui Li, Yintang Yang:
Light-load efficiency improving boost converter with the hybrid modulation of hysteresis current mode and burst mode. IEICE Electron. Express 16(11): 20190108 (2019) - [j7]Yang Li, Changchun Chai, Yuqian Liu, Yun Li, Han Wu, Wei Zhang, Fuxing Li, Yintang Yang:
Upset and damage mechanisms of the three-dimensional silicon device induced by high power microwave interference. IEICE Electron. Express 16(19): 20190498 (2019) - 2016
- [j6]Qidong Zhang, Yintang Yang, Changchun Chai:
An area-efficient and high speed multiplexer for battery monitor system. IEICE Electron. Express 13(8): 20160120 (2016) - [j5]Yang Liu, Changchun Chai, Qingyang Fan, ChunLei Shi, Xiaowen Xi, Xinhai Yu, Yintang Yang:
Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse. Microelectron. Reliab. 66: 32-37 (2016) - 2015
- [j4]Xinhai Yu, Changchun Chai, Yang Liu, Yintang Yang:
Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter. Sci. China Inf. Sci. 58(8): 1-11 (2015) - [j3]Xinhai Yu, Changchun Chai, Yang Liu, Yintang Yang, Qingyang Fan:
Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. Microelectron. Reliab. 55(8): 1174-1179 (2015) - 2012
- [j2]Xiang Gao, Yintang Yang, Duan Zhou, Jianxian Zhang, Changchun Chai:
Target Tracking Approximation Algorithms with Particle Filter Optimization and Fault-Tolerant Analysis in Wireless Sensor Networks. J. Networks 7(5): 832-837 (2012)
2000 – 2009
- 2008
- [j1]Zhenyu Wu
Temperature-dependent stress-induced voiding in dual-damascene Cu interconnects. Microelectron. Reliab. 48(4): 578-583 (2008)
Coauthor Index
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