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Bart M. Nicolaï
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Journal Articles
- 2024
- [j14]Astrid Tempelaere, Jiaqi He, Leen Van Doorselaer, Pieter Verboven, Bart M. Nicolaï, Mario Valerio Giuffrida:
Unsupervised anomaly detection for pome fruit quality inspection using X-ray radiography. Comput. Electron. Agric. 226: 109364 (2024) - 2023
- [j13]Astrid Tempelaere, Hoang Minh Phan, Tim Van De Looverbosch, Pieter Verboven, Bart M. Nicolaï:
Non-destructive internal disorder segmentation in pear fruit by X-ray radiography and AI. Comput. Electron. Agric. 212: 108142 (2023) - 2022
- [j12]Tim Van De Looverbosch, Jiaqi He, Astrid Tempelaere, Klaas Kelchtermans, Pieter Verboven, Tinne Tuytelaars, Jan Sijbers, Bart M. Nicolaï:
Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images. Comput. Electron. Agric. 197: 106962 (2022) - [j11]Tim Van De Looverbosch, Bert Vandenbussche, Pieter Verboven, Bart M. Nicolaï:
Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning. Comput. Electron. Agric. 200: 107228 (2022) - [j10]Arno Strouwen, Bart M. Nicolaï, Peter Goos:
Robust dynamic experiments for the precise estimation of respiration and fermentation parameters of fruit and vegetables. PLoS Comput. Biol. 18(1) (2022) - 2021
- [j9]Tim Van De Looverbosch, Ellen Raeymaekers, Pieter Verboven, Jan Sijbers, Bart M. Nicolaï:
Non-destructive internal disorder detection of Conference pears by semantic segmentation of X-ray CT scans using deep learning. Expert Syst. Appl. 176: 114925 (2021) - 2018
- [j8]Wentao Wu, Paul Cronjé, Bart M. Nicolaï, Pieter Verboven, Umezuruike Linus Opara, Thijs Defraeye:
Virtual cold chain method to model the postharvest temperature history and quality evolution of fresh fruit - A case study for citrus fruit packed in a single carton. Comput. Electron. Agric. 144: 199-208 (2018) - 2017
- [j7]Luis Filipe Alves Pereira, Eline Janssens, George D. C. Cavalcanti, Ing Ren Tsang, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers:
Inline discrete tomography system: Application to agricultural product inspection. Comput. Electron. Agric. 138: 117-126 (2017) - [j6]Antonio Derossi, Bart M. Nicolaï, Pieter Verboven, Carla Severini:
Characterizing apple microstructure via directional statistical correlation functions. Comput. Electron. Agric. 138: 157-166 (2017) - 2016
- [j5]Wouter Devarrewaere, Udo Heimbach, Dieter Foqué, Bart M. Nicolaï, David Nuyttens, Pieter Verboven:
Wind tunnel and CFD study of dust dispersion from pesticide-treated maize seed. Comput. Electron. Agric. 128: 27-33 (2016) - 2009
- [j4]Jeroen De Temmerman, Pascal Dufour, Bart M. Nicolaï, Herman Ramon:
MPC as control strategy for pasta drying processes. Comput. Chem. Eng. 33(1): 50-57 (2009) - 2008
- [j3]Q. Tri Ho, Pieter Verboven, Bert E. Verlinden, Jeroen Lammertyn, Stefan Vandewalle, Bart M. Nicolaï:
A Continuum Model for Metabolic Gas Exchange in Pear Fruit. PLoS Comput. Biol. 4(3) (2008) - 2007
- [j2]Bert Seynaeve, Eveline Rosseel, Bart M. Nicolaï, Stefan Vandewalle:
Fourier mode analysis of multigrid methods for partial differential equations with random coefficients. J. Comput. Phys. 224(1): 132-149 (2007) - 2004
- [j1]F. Poschet, Kristel Bernaerts, A. H. Geeraerd, Nico Scheerlinck, Bart M. Nicolaï, Jan F. M. Van Impe:
Sensitivity analysis of microbial growth parameter distributions with respect to data quality and quantity by using Monte Carlo analysis. Math. Comput. Simul. 65(3): 231-243 (2004)
Conference and Workshop Papers
- 2023
- [c4]Astrid Tempelaere, Leen Van Doorselaer, Jiaqi He, Pieter Verboven, Tinne Tuytelaars, Bart M. Nicolaï:
Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging. ICCV (Workshops) 2023: 552-560 - 2020
- [c3]Eskindir E. Tadesse, Hirut Assaye, Mulugeta Admasu Delele, Solomon Workneh Fanta, Dawit F. Huluka, Melkamu Alemayehu, Getachew Alemayehu, Enyew Adgo, Jan Nyssen, Pieter Verboven, Bart M. Nicolaï:
Quantitative Postharvest Loss Assessment of Tomato Along the Postharvest Supply Chain in Northwestern Ethiopia. ICAST (1) 2020: 110-122 - 2015
- [c2]Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers:
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP 2015: 917-921 - 1992
- [c1]Bart M. Nicolaï, Josse De Baerdemaeker:
Stochastic Finite Element Analysis of Conduction Heat Transfer in Foods with Random Field Thermophysical Properties. EUROSIM 1992: 581-586
Coauthor Index
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