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IEEE Instrumentation & Measurement Magazine, Volume 20
Volume 20, Number 1, February 2017
- Wendy Van Moer:
Welcome 2017 [Editorial]. 2 - Veronica Scotti:
Profiling: A promising field for metrologists [Guest Editorial]. 3 - Alessandro Ferrero
:
DNA profiling: A metrological and signal processing perspective. 4-7 - Richard Davis
Science and Precision Measurement. 8-10 - Charles Georget, Aime Conigliaro:
A perspective on bitemark analysis: from empiricism to scientific rationality. 11-14 - Henry Swofford, Ted Vosk:
Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles. 15-19 - Pasquale Daponte
Analog-to-information converters in the wideband rf measurement for aerospace applications: current situation and perspectives. 20-28 - Irina Florea:
Merging theoretical concepts with practice. 29-30 - Wendy Meulebroeck
Photonics enhanced sensors for food monitoring: part 2. 31-37 - Octavian Adrian Postolache
Development and selection of balance sensing devices. 38-48 - Robert M. Goldberg:
New Products. 49-54
Volume 20, Number 2, April 2017
- Wendy Van Moer:
I&M around the World [Editorial]. 2 - Jorge Daher:
Highlighting Latin American authors [Guest Editorial]. 2-3 - John Soldera
Facial biometrics and applications. 4-10 - Jean-Michel Pou:
A smart approach to calibration - why we should forget calendar-based calibrations. 11-12 - Hugo Cesar Rocha Liborio Tenorio, Debora Albuquerque Vieira, Cleonilson Protásio de Souza
Measurement of parameters and degradation of thermoelectric modules. 13-19 - J. Max Cortner:
Mission critical [Life After Graduation]. 20 - Guilherme Bertelli, Anderson Santos, Ivanovitch Silva
Research activities on industrial wireless instrumentation: Brazilian perspective. 21-30 - Virginica Dinut:
Biofeedback in Psychotherapy [Trends in Future I&M]. 31-32 - German A. Alvarez-Botero
Optical sensing using fiber bragg gratings: fundamentals and applications. 33-38 - Richard Davis
From telegraphy to the revised SI [Basic Metrology]. 39-42 - Joao A. F. Ferreira, Antonio Petraglia:
Analog integrated lock-in amplifier for optical sensors. 43-50 - Joao A. F. Ferreira, Antonio Petraglia:
Analog integrated lock-in amplifier for optical sensors. 43-50 - Rodrigo H. Murofushi, Jose J. P. Z. S. Tavares:
Towards fourth industrial revolution impact: smart product based on RFID technology. 51-56 - Robert M. Goldberg:
New products. 63-67
Volume 20, Number 3, June 2017
- Wendy Van Moer:
I&M for farmers [Editorial]. 2 - Samir Trabelsi:
New Technologies in Agriculture [Guest Editorial]. 2-3 - Aaron Patrick, Sara Pelham, Albert Culbreath, C. Corely Holbrook, Ignácio José De Godoy, Changying Li:
High throughput phenotyping of tomato spot wilt disease in peanuts using unmanned aerial systems and multispectral imaging. 4-12 - Richard Davis, Oon-Doo Baik, Shahab Sokhansanj:
How to measure a lobster or size an egg [Basicmetrology]. 13-42 - Richard A. Speir, Mark A. Haidekker:
Onion postharvest quality assessment with x-ray computed tomography - A pilot study. 15-19 - Dominique Henry, Hervé Aubert
Remote estimation of intra-parcel grape quantity from three-dimensional imagery technique using ground-based microwave FMCW radar. 20-24 - Markos Asprou:
Synchronized measurement technology: A blessing for power systems [Trends in Future I&M]. 25-42 - Andrea Cataldo, Egidio De Benedetto
TDR application for moisture content estimation in agri-food materials. 26-31 - Chandra B. Singh, John M. Fielke
Recent developments in stored grain sensors, monitoring and management technology. 32-55 - Bijay L. Shrestha, Hugh C. Wood, Lope Tabil
Microwave permittivity-assisted artificial neural networks for determining moisture content of chopped alfalfa forage. 37-42 - Domenico Luca Carnì, Domenico Grimaldi, Alfonso Nastro, Vitaliano Spagnuolo, Francesco Lamonaca
Blood oxygenation measurement by smartphone. 43-49 - Robert M. Goldberg:
New products. 50-54
Volume 20, Number 4, August 2017
- Ruth A. Dyer, Teresa Pace:
Welcome to IEEE AUTOTESTCON 2017 [President's Message]. 2 - Tarek K. Helaly, Nikhil V. Adnani:
A fourth category of software-defined instrumentation for wireless test. 3-10 - Peter A. Lindahl
Noncontact electrical system monitoring on a U.S. Coast Guard cutter. 11-20 - George Cornea:
A young perspective of power systems measurement and protection [Trends in Future I&M]. 21-22 - Igor Aleksejev
Run-time reconfigurable instruments for advanced board-level testing. 23-30 - Richard Davis:
Reinventing the Wheel [Basic Metrology]. 31-33 - Zhiping Liu
Image processing algorithms for crack detection in welded structures via pulsed eddy current thermal imaging. 34-44 - Niclas Björsell, Wendy Van Moer:
Measuring and characterizing nonlinear RF systems. 45-48 - Rodrigo Wolff Porto, Valner Joao Brusamarello, Ivan Müller
Wireless power transfer for contactless instrumentation and measurement. 49-54 - Katelyn R. Brinker:
NASA space technology research fellowship award [Society News]. 55-56 - Robert M. Goldberg:
New products. 60-64
Volume 20, Number 5, October 2017
- Wendy Van Moer:
Big data in I&M [Editorial]. 2 - Dario Petri:
Big Data in Instrumentation and Measurement [Guest Editorial]. 3 - Luca Mari
The metrological culture in the context of big data: managing data-driven decision confidence. 4-20 - Jean-Michel Pou:
The Metrologist's place is by the machines! 10-29 - Francesco Mari, Paolo Masini:
Big data at work: the practitioners' point of view. 13-20 - Irina Florea:
Future trends in security for Instrumentation and Measurement [Trends in Future I&M]. 21-22 - Veronica Scotti:
Big data or big (privacy) problem? 23-26 - Richard Davis:
The story of Invar [Basice Metrology]. 27-29 - Franco Baroncini, Simona Salicone
How synchronization evolved from analog to digital in the TLC world. 30-34 - Sayantan Sinha
Implementation of an 8-bit ADC using successive subtraction technique. 35-38 - Oluyemi Omomukuyo, Octavia A. Dobre
Bandwidth-efficient synchronization for fiber optic transmission: system performance measurements. 39-45 - Wendy Meulebroeck
Photonics enhanced sensors for food monitoring: Part 3. 46-55 - Robert M. Goldberg:
New products. 59-63
Volume 20, Number 6, December 2017
- Wendy Van Moer:
I&M in Industry [Editorial]. 2 - Simone Corbellini:
The pervasive role of measurements in the industrial world [Guest Editorial]. 3 - Pasquale Daponte, Luca De Vito
DronesBench: an innovative bench to test drones. 8-15 - Luciana Bonino, Stefano Cesare, Luca Massotti, Sergio Mottini, Kolja Nicklaus, Marco Pisani, Pierluigi Silvestrin:
Laser metrology for next generation gravity mission. 16-21 - Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond:
Smart metrology: the importance of metrology of decisions in the big data era. 22-29 - Stefano Rinaldi:
The role of measurement in smart cities pilot projects [Future I&M]. 28-29 - Dimosthenis E. Bolanakis
MEMS barometers and barometric altimeters in industrial, medical, aerospace, and consumer applications. 30-55 - Luciane Agnoletti Dos Santos Pedotti, Ricardo Mazza Zago, Fabiano Fruett:
Fault diagnostics in rotary machines through spectral vibration analysis using low-cost MEMS devices. 39-44 - Jackie Ferguson, Chris Burns:
Yardsticks of science: the origins and future of the international unit. 45-48 - Fouzi Harrou
Vision-based fall detection system for improving safety of elderly people. 49-55 - Jie Wu, Bing Nan Li:
Development of a magnetoinductive lens for magnetic resonance imaging. 56-60 - J. Max Cortner:
By the Numbers! [Life After Graduation]. 61-66 - Sergio Rapuano:
Chapter chair summit 2017 [Society News]. 62-66 - Robert M. Goldberg:
New products. 67-71
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