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"Gate-Level Redundancy: A New Design-for-Reliability Paradigm for ..."

Ali Namazi, Mehrdad Nourani (2010)

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DOI: 10.1109/TVLSI.2009.2016206

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/NamaziN10
Ali Namazi, Mehrdad Nourani:
Gate-Level Redundancy: A New Design-for-Reliability Paradigm for Nanotechnologies. IEEE Trans. Very Large Scale Integr. Syst. 18(5): 775-786 (2010)

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