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"Gate leakage reduction for scaled devices using transistor stacking."

Saibal Mukhopadhyay et al. (2003)

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DOI: 10.1109/TVLSI.2003.816145

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/MukhopadhyayNCAKR03
Saibal Mukhopadhyay, Cassondra Neau, R. T. Cakici, Amit Agarwal, Chris H. Kim, Kaushik Roy:
Gate leakage reduction for scaled devices using transistor stacking. IEEE Trans. Very Large Scale Integr. Syst. 11(4): 716-730 (2003)

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