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"AC-Plus Scan Methodology for Small Delay Testing and Characterization."

Tsung-Yeh Li et al. (2013)

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DOI: 10.1109/TVLSI.2012.2187223

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tvlsi/LiHHTHLMHBTWW13
Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu:
AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 329-341 (2013)

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