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"Diagnosis of single stuck-at faults and multiple timing faults in scan chains."

James Chien-Mo Li (2005)

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DOI: 10.1109/TVLSI.2005.848800

access: closed

type: Journal Article

metadata version: 2020-03-11

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James Chien-Mo Li:
Diagnosis of single stuck-at faults and multiple timing faults in scan chains. IEEE Trans. Very Large Scale Integr. Syst. 13(6): 708-718 (2005)

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