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"Embedded Test Decompressor to Reduce the Required Channels and Vector ..."
Yinhe Han et al. (2007)
- Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra:
Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit. IEEE Trans. Very Large Scale Integr. Syst. 15(5): 531-540 (2007)
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