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"MICRO: a new hybrid test data compression/decompression scheme."

Sunghoon Chun et al. (2006)

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DOI: 10.1109/TVLSI.2006.878227

access: closed

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/tvlsi/ChunKIK06
Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 649-654 (2006)

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